Share by email

IEC 62047-32

IEC 62047-32:2019
Semiconductor devices - Micro-electromechanical devices - Part 32: Test method for the nonlinear vibration of MEMS resonators
IEC 62047-32:2019 specifies the test method and test condition for the nonlinear vibration of MEMS resonators. The statements made in this document apply to the development and manufacture for MEMS resonators.
BASE PUBLICATION
English/French

Technical committee

TC 47/SC 47F Micro-electromechanical systems
Publication typeInternational Standard
Publication date2019-01-24
Edition1.0
ICS

31.080.99

Stability date2026
ISBN number9782832264553
Pages37
File size1.49 MB
EditionDatePublicationEditionStatus
  • Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation

  • Strengthen the means of implementation and revitalize the global partnership for sustainable development

See more

Related publications