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IEC Technical Specification 62607-8-1

IEC TS 62607-8-1:2020
Nanomanufacturing - Key control characteristics - Part 8-1: Nano-enabled metal-oxide interfacial devices - Test method for defect states by thermally stimulated current
IEC TS 62607-8-1:2020 There are two types of thermally stimulated current (TSC) measurement methods, classified by the origin of the current. One is generated by the detrapping of charges. The other one is generated by depolarization. IEC TS 62607-8-1:2020 focuses on the former method, and specifies the measurement method to be developed for determining defect states of nano-enabled metal-oxide interfacial devices.
IEC TS 62607-8-1:2020 includes:
– outlines of the experimental procedures used to measure TSC,
– methods of interpretation of results and discussion of data analysis, and
– case studies.
BASE PUBLICATION
English

Technical committee

TC 113 Nanotechnology for electrotechnical products and systems
Publication typeTechnical Specification
Publication date2020-04-09
Edition1.0
ICS

07.120

07.030

Stability date2026
ISBN number9782832279786
Pages29
File size2.46 MB
EditionDatePublicationEditionStatus
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