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IEC 62047-28

IEC 62047-28:2017
Semiconductor devices - Micro-electromechanical devices - Part 28: Performance testing method of vibration-driven MEMS electret energy harvesting devices
IEC 62047-28:2017(E) specifies terms and definitions, and a performance testing method of vibration driven MEMS electret energy harvesting devices to determine the characteristic parameters for consumer, industry or any application.
This document applies to vibration driven electret energy harvesting devices whose electrodes with a gap below 1 000 μm are covered by dielectric material with trapped charges and are fabricated by MEMS processes such as etching, photolithography or deposition.
BASE PUBLICATION
English

Technical committee

TC 47 Semiconductor devices
Publication typeInternational Standard
Publication date2017-01-20
Edition1.0
ICS

31.080.99

Stability date2025
ISBN number9782832238196
Pages17
File size1.45 MB
EditionDatePublicationEditionStatus
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