IEC 62979
IEC 62979:2017
Photovoltaic modules - Bypass diode - Thermal runaway test
IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
CHF 80.-
Technical committee
TC 82 Solar photovoltaic energy systemsCategory
Quality Assurance - SafetyPublication type | International Standard |
Publication date | 2017-08-10 |
Edition | 1.0 |
ICS | 27.160 |
Stability date | 2026 |
ISBN number | 9782832272916 |
Pages | 13 |
File size | 1.28 MB |
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