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IEC 62979

IEC 62979:2017
Photovoltaic modules - Bypass diode - Thermal runaway test
IEC 62979:2017 provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. This test methodology is particularly suited for testing of Schottky barrier diodes, which have the characteristic of increasing leakage current as a function of reverse bias voltage at high temperature, making them more susceptible to thermal runaway.
BASE PUBLICATION

Technical committee

TC 82 Solar photovoltaic energy systems

Category

Quality Assurance - Safety
Publication typeInternational Standard
Publication date2017-08-10
Edition1.0
ICS

27.160

Stability date2026
ISBN number9782832272916
Pages13
File size1.28 MB
EditionDatePublicationEditionStatus
  • Ensure access to affordable, reliable, sustainable and modern energy for all

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  • Take urgent action to combat climate change and its impacts

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