IEC 61189-5-503
IEC 61189-5-503:2017
Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
IEC 61189-5-503:2017 specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity cyclic test and an unsaturated pressurized vapour test (HAST).
CHFÂ 155.-
Technical committee
TC 91 Electronics assembly technologyCategory
Quality Assurance| Publication type | International Standard |
| Publication date | 2017-05-22 |
| Edition | 1.0 |
| ICS | 31.180 |
| Stability date | 2027 |
| ISBN number | 9782832273623 |
| Pages | 23 |
| File size | 1.32 MB |
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