IEC 62899-503-1
IEC 62899-503-1:2020
Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor
IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).
CHFÂ 80.-
Technical committee
TC 119 Printed Electronics| Publication type | International Standard |
| Publication date | 2020-05-27 |
| Edition | 1.0 |
| ICS | 29.045 31.080.30 |
| Stability date | 2025 |
| ISBN number | 9782832283783 |
| Pages | 15 |
| File size | 1.60 MB |
Ensure sustainable consumption and production patterns