IEC Technical Specification 62607-9-1
IEC TS 62607-9-1:2021
Nanomanufacturing - Key control characteristics - Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements - Magnetic force microscopy
IEC TS 62607-9-1:2021(E) establishes a standardized method to characterize spatially varying magnetic fields with a spatial resolution down to 10 nm for flat magnetic specimens by magnetic force microscopy (MFM). MFM primarily detects the stray field component perpendicular to the sample surface. The resolution is achieved by the calibration of the MFM tip using magnetically nanostructured reference materials.
CHF 345.-
Technical committee
TC 113 Nanotechnology for electrotechnical products and systems| Publication type | Technical Specification |
| Publication date | 2021-10-14 |
| Edition | 1.0 |
| ICS | 07.120 |
| Stability date | 2024 |
| ISBN number | 9782832243787 |
| Pages | 63 |
| File size | 4.72 MB |
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