Consolidated version
The content of amendment(s) is incorporated into the publication. The track changes mode shows where the publication has been modified by the amendment.
IEC 60747-1:2006+AMD1:2010 CSV
IEC 60747-1
IEC 60747-1:2006
Semiconductor devices - Part 1: General
IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below:
a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted.
b) There has been a general revision of guidance on essential ratings and characteristics.
c) The distinction between general and reference methods of measurement has been removed.
d) A clause on product discontinuation notice has been added.
a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted.
b) There has been a general revision of guidance on essential ratings and characteristics.
c) The distinction between general and reference methods of measurement has been removed.
d) A clause on product discontinuation notice has been added.
CHF 270.-
Consolidated version
The content of amendment(s) is incorporated into the publication. The track changes mode shows where the publication has been modified by the amendment.
DiscoverTechnical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2006-02-21 |
| Edition | 2.0 |
| ICS | 31.080.01 |
| Stability date | 2028 |
| ISBN number | 9782889102730 |
| Pages | 89 |
| File size | 1.41 MB |
Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation