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IEC 60748-11-1

IEC 60748-11-1:1992
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
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Technical committee

TC 47/SC 47A Integrated circuits
Publication typeInternational Standard
Publication date1992-04-01
Edition1.0
ICS

31.200

Stability date2026
ISBN number2831823064
Pages71
File size2.24 MB
EditionDatePublicationEditionStatus
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