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IEC Technical Specification 62804-2

IEC TS 62804-2:2022
Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 2: Thin-film
IEC TS 62804-2:2022 defines apparatus and procedures to test and evaluate the durability of photovoltaic (PV) modules to power loss by the effects of high voltage stress in a damp heat environment, referred to as potential-induced degradation (PID). This document defines a test method that compares the coulomb transfer between the active cell circuit and ground through the module packaging under voltage stress during accelerated stress testing with the coulomb transfer during outdoor testing to determine an acceleration factor for the PID.
This document tests for the degradation mechanisms involving mobile ions influencing the electric field over the semiconductor absorber layer or electronically interacting with the films such that module power is affected.
BASE PUBLICATION
English

Technical committee

TC 82 Solar photovoltaic energy systems

Category

Quality Assurance
Publication typeTechnical Specification
Publication date2022-03-29
Edition1.0
ICS

27.160

Stability date2025
ISBN number9782832243794
Pages44
File size1.88 MB
EditionDatePublicationEditionStatus
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