IEC 60749-2
IEC 60749-2:2002
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V.
This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.
The contents of the corrigendum of August 2003 have been included in this copy.
This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.
The contents of the corrigendum of August 2003 have been included in this copy.
CHF 20.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2002-04-12 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 2831862817 |
| Pages | 11 |
| File size | 375.56 KB |
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