IEC 60749-41
IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
CHFÂ 155.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2020-07-22 |
| Edition | 1.0 |
| ICS | 31.080.01 |
| Stability date | 2031 |
| ISBN number | 9782832286401 |
| Pages | 44 |
| File size | 1.47 MB |
Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation