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IEC 60749-41

IEC 60749-41:2020
Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices
IEC 60749-41:2020 specifies the procedural requirements for performing valid endurance, retention and cross-temperature tests based on a qualification specification. Endurance and retention qualification specifications (for cycle counts, durations, temperatures, and sample sizes) are specified in JESD47 or are developed using knowledge-based methods such as in JESD94.
BASE PUBLICATION
English/French

Technical committee

TC 47 Semiconductor devices
Publication typeInternational Standard
Publication date2020-07-22
Edition1.0
ICS

31.080.01

Stability date2027
ISBN number9782832286401
Pages44
File size1.47 MB
EditionDatePublicationEditionStatus
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