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IEC 63011-2

IEC 63011-2:2018
Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect
IEC 63011-2:2018 provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.
BASE PUBLICATION
English/French

Technical committee

TC 47/SC 47A Integrated circuits
Publication typeInternational Standard
Publication date2018-11-28
Edition1.0
ICS

31.200

Stability date2029
ISBN number9782832262917
Pages28
File size1.54 MB
EditionDatePublicationEditionStatus
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