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IEC 63202-1

IEC 63202-1:2019
Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.
BASE PUBLICATION

Technical committee

TC 82 Solar photovoltaic energy systems

Category

Quality Assurance

Keywords

Water management - Smart city - Rural electrification - Solar power - Solar panel - Photovoltaic - PV - LVDC
Publication typeInternational Standard
Publication date2019-06-20
Edition1.0
ICS

27.160

Stability date2025
ISBN number9782832268964
Pages17
File size1.08 MB
EditionDatePublicationEditionStatus
  • Ensure access to affordable, reliable, sustainable and modern energy for all

  • Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation

  • Take urgent action to combat climate change and its impacts

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