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IEC 63202-1

IEC 63202-1:2019
Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield.

Technical committee

TC 82 Solar photovoltaic energy systems


Quality Assurance


Water management - Smart city - Rural electrification - Solar power - Solar panel - Photovoltaic - PV - LVDC
Publication typeInternational Standard
Publication date2019-06-20


Stability date2025
ISBN number9782832268964
File size1.08 MB
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