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IEC 61163-1

IEC 61163-1:2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an unacceptably low reliability in the early failure period, and when other methods, such as reliability growth programmes and quality control techniques, are not applicable.
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Technical committee

TC 56 Dependability
Publication typeInternational Standard
Publication date2006-06-26
Edition2.0
ICS

03.120.01

03.120.30

21.020

Stability date2029
ISBN number283188683X
Pages161
File size1.45 MB
EditionDatePublicationEditionStatus

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