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IEC 61163-2 Revised

IEC 61163-2:1998
Reliability stress screening - Part 2: Electronic components
Provides guidance on reliability stress screening techniques and procedures for electronic components. Is intended for use of a) component manufacturers as a guideline, b) component users as a guideline to negotiate with component manufacturers on stress screening requirements or plan a stress screening process in house due to reliability requirements, c) subcontractors who provide stress screening as a service.
BASE PUBLICATION
  CHF 260.-
A more recent version of this publication exists: IEC 61163-2:2020

Technical committee

TC 56 Dependability
Publication typeInternational Standard
Publication date1998-11-27
Edition1.0
ICS

03.120.01

31.020

Withdrawal date2020-03-11
ISBN number2831845602
Pages69
File size547.33 KB
EditionDatePublicationEditionStatus

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