IEC 61580-9
IEC 61580-9:1996
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
CHFÂ 20.-
Technical committee
TC 46/SC 46F RF and microwave passive componentsPublication type | International Standard |
Publication date | 1996-07-03 |
Edition | 1.0 |
ICS | 17.220.20 33.120.10 |
Stability date | 2028 |
Pages | 15 |
File size | 633.22 KB |
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