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IEC 61580-9

IEC 61580-9:1996
Methods of measurement for waveguides - Part 9: Reflection coefficient at rectangular waveguide interfaces
Gives the means for determining the reflection coefficient at the junction of two similar rectanglular waveguides due to: differences in the wavguide internal dimensions, lateral displacement between the waveguide axes in either the H or E plane and angular misalignment between the waveguide axes.
BASE PUBLICATION
English/French
  CHF 20.-

Technical committee

TC 46/SC 46F RF and microwave passive components
Publication typeInternational Standard
Publication date1996-07-03
Edition1.0
ICS

17.220.20

33.120.10

Stability date2028
Pages15
File size633.22 KB
EditionDatePublicationEditionStatus
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