IEC 60749-12
IEC 60749-12:2017
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.
CHF 20.-
Technical committee
TC 47 Semiconductor devicesCategory
Quality Assurance| Publication type | International Standard |
| Publication date | 2017-12-13 |
| Edition | 2.0 |
| ICS | 31.080.01 |
| Stability date | 2029 |
| ISBN number | 9782832251560 |
| Pages | 14 |
| File size | 1010.01 KB |
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