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IEC 60747-5-9

IEC 60747-5-9:2019
Semiconductor devices - Part 5-9: Optoelectronic devices - Light emitting diodes - Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
IEC 60747-5-9:2019(E) specifies the measuring method of the internal quantum efficiency (IQE) of single light emitting diode (LED) chips or packages without phosphor. White LEDs for lighting applications are out of the scope of this document. This document utilizes the relative external quantum efficiencies (EQEs) measured at cryogenic temperatures and at an operating temperature, which is called temperature-dependent electroluminescence (TDEL). In order to identify the reference IQE of 100 %, the maximum values of the peak EQE are found by varying the environmental temperature and current.
BASE PUBLICATION
English
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Technical committee

TC 47/SC 47E Discrete semiconductor devices
Publication typeInternational Standard
Publication date2019-12-11
Edition1.0
ICS

31.080.99

Stability date2025
ISBN number9782832276563
Pages19
File size1.97 MB
EditionDatePublicationEditionStatus
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