Share by email

IEC 61967-4 Revised

IEC 61967-4:2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
The contents of the corrigendum 1 of June 2017 have been included in this copy.
BASE PUBLICATION
English/French
  CHF 200.-
A more recent version of this publication exists: IEC 61967-4:2021 RLV

Technical committee

TC 47/SC 47A Integrated circuits

Category

Electromagnetic Compatibility
Publication typeInternational Standard
Publication date2002-04-30
Edition1.0
ICS

31.200

Withdrawal date2021-03-16
ISBN number2831863015
Pages57
File size2.03 MB
EditionDatePublicationEditionStatus
  • Build resilient infrastructure, promote inclusive and sustainable industrialization and foster innovation

See more

Related publications