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IEC TS 61994-4-4:2018 RLV
IEC Technical Specification 61994-4-4
IEC TS 61994-4-4:2018
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
IEC 61994-4-4:2018 gives the terms and definition for single crystal wafers for surface acoustic wave (SAW) devices representing the state of the art. This edition includes the following significant technical changes with respect to the previous edition:
- the new terms and definitions given in IEC 62276:2016 have been taken into account;
- the general title has been changed according to the change in the title of TC 49 in 2009.
- the part title has been changed according to the title of IEC 62276:2016.
- the new terms and definitions given in IEC 62276:2016 have been taken into account;
- the general title has been changed according to the change in the title of TC 49 in 2009.
- the part title has been changed according to the title of IEC 62276:2016.
CHFÂ 80.-
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DiscoverTechnical committee
TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionCategory
Quality AssurancePublication type | Technical Specification |
Publication date | 2018-11-16 |
Edition | 3.0 |
ICS | 01.040.31 31.140 |
Stability date | 2026 |
ISBN number | 9782832261781 |
Pages | 14 |
File size | 238.26 KB |
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