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IEC 62047-21

IEC 62047-21:2014
Semiconductor devices - Micro-electromechanical devices - Part 21: Test method for Poisson's ratio of thin film MEMS materials
IEC 62047-21:2014 specifies the determination of Poisson's ratio from the test results obtained by the application of uniaxial and biaxial loads to thin-film micro-electromechanical systems (MEMS) materials with lengths and widths less than 10 mm and thicknesses less than 10 µm.
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Technical committee

TC 47/SC 47F Micro-electromechanical systems
Publication typeInternational Standard
Publication date2014-06-19
Edition1.0
ICS

31.080.99

Stability date2027
ISBN number9782832216507
Pages26
File size1.57 MB
EditionDatePublicationEditionStatus
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