IEC 62899-503-3
IEC 62899-503-3:2021
Printed electronics - Part 503-3: Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method
IEC 62899-503-3:2021(E) specifies a measuring method of contact resistance for printed thin film transistors (TFTs) by the transfer length method (TLM). The method requires the fabrication of a test element group (TEG) with varying channel length (L) between source and drain electrodes. The method is intended for quality assessment of TFT electrode contacts and is suited for determining whether the contact resistance lies within a desired range.
CHFÂ 80.-
Technical committee
TC 119 Printed Electronics| Publication type | International Standard |
| Publication date | 2021-08-24 |
| Edition | 1.0 |
| ICS | 29.045 31.080.30 |
| Stability date | 2026 |
| ISBN number | 9782832254387 |
| Pages | 13 |
| File size | 1.16 MB |
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