IEC 62047-40
IEC 62047-40:2021
Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold
IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.
CHFÂ 40.-
Technical committee
TC 47/SC 47F Micro-electromechanical systems| Publication type | International Standard |
| Publication date | 2021-09-03 |
| Edition | 1.0 |
| ICS | 31.080.99 |
| Stability date | 2025 |
| ISBN number | 9782832251737 |
| Pages | 11 |
| File size | 1.18 MB |
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