IEC Technical Specification 62215-2
IEC TS 62215-2:2007
Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
Contains general information and definitions on the test method to evaluate the immunity of integrated circuits (ICs) against fast conducted synchronous transient disturbances.The objective is to describe general conditions to obtain a quantitative measure of immunity of ICs establishing a uniform testing environment. Critical parameters that are expected to influence the test results are described. Deviations from this specification should be explicitly noted in the individual test report. This synchronous transient immunity measurement method uses short impulses with fast rise times of different amplitude, duration and polarity in a conductive mode to the IC. In this method, the applied impulse has to be synchronized with the activity of the IC to make sure that controlled and reproducible conditions can be assured
CHFÂ 200.-
Technical committee
TC 47/SC 47A Integrated circuitsPublication type | Technical Specification |
Publication date | 2007-09-10 |
Edition | 1.0 |
ICS | 31.200 |
Stability date | 2025 |
ISBN number | 2831893054 |
Pages | 27 |
File size | 1.09 MB |
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