IEC 60747-18-4
IEC 60747-18-4:2023
Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.
CHFÂ 80.-
Technical committee
TC 47/SC 47E Discrete semiconductor devicesPublication type | International Standard |
Publication date | 2023-03-16 |
Edition | 1.0 |
ICS | 31.080.99 |
Stability date | 2025 |
ISBN number | 9782832266434 |
Pages | 14 |
File size | 1012.24 KB |
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