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IEC 62433-2 Revised

IEC 62433-2:2008
EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
IEC 62433-2:2008 specifies macro-models for ICs to simulate conducted electromagnetic emissions on a printed circuit board. The model is commonly called Integrated Circuit Emission Model - Conducted Emission (ICEM-CE). The ICEM-CE model can also be used for modelling an IC-die, a functional block and an Intellectual Property block (IP). The ICEM-CE model can be used to model both digital and analogue ICs. Basically, conducted emissions have two origins:
- conducted emissions through power supply terminals and ground reference structures;
- conducted emissions through input/output (I/O) terminals. The ICEM-CE model addresses those two types of origins in a single approach. This standard defines structures and components of the macro-model for EMI simulation taking into account the IC's internal activities. This standard gives general data, which can be implemented in different formats or languages such as IBIS, IMIC, SPICE, VHDL-AMS and Verilog. SPICE is however chosen as default simulation environment to cover all the conducted emissions. This standard also specifies requirements for information that shall be incorporated in each ICEM-CE model or component part of the model for model circulation, but description syntax is not within the scope of this standard.
BASE PUBLICATION
  CHF 295.-
A more recent version of this publication exists: IEC 62433-2:2017

Technical committee

TC 47/SC 47A Integrated circuits

Category

Electromagnetic Compatibility
Publication typeInternational Standard
Publication date2008-10-08
Edition1.0
ICS

31.200

Withdrawal date2017-01-27
ISBN number9782889107025
Pages93
File size2.38 MB
EditionDatePublicationEditionStatus

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