IEC Technical Report 63571
IEC TR 63571:2025
Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
IEC TR 63571:2025 describes a method to calculate “SYSTEM”-level lifetime from “PART”-level lifetime. It presents a general mathematical theory and simple calculation examples for educational purposes. Of the elements related to “SYSTEM”-level lifetime, software-related elements such as diagnostics are outside the scope of this document.
CHF 155.-
Technical committee
TC 47 Semiconductor devicesCategory
Quality Assurance| Publication type | Technical Report |
| Publication date | 2025-05-13 |
| Edition | 1.0 |
| ICS | 31.080.99 |
| Stability date | 2029 |
| ISBN number | 9782832704158 |
| Pages | 24 |
| File size | 720.39 KB |
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