IEC 62506 Commented version

IEC 62506:2023 CMV contains both the official standard and its commented version. The commented version provides you with a quick and easy way to compare all the changes between IEC 62506:2023 edition 2.0 and the previous IEC 62506:2013 edition 1.0. Furthermore, comments from IEC TC 56 experts are provided to explain the reasons of the most relevant changes, or to clarify any part of the content.

IEC 62506:2023 provides guidance on the application of various accelerated test techniques for measurement or improvement of item reliability. Identification of potential failure modes that can be experienced in the use of an item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item reliability, or to achieve necessary reliability and availability improvement, all within a compressed or accelerated period of time. This document addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability can differ from the standard probability of failure occurrence. This document also extends to present accelerated testing or production screening methods that would identify weakness introduced into the item by manufacturing error, which can compromise item reliability. Services and people are however not covered by this document.