IEC 60300-3-7:1999 Withdrawn

Dependability management - Part 3-7: Application guide - Reliability stress screening of electronic hardware

Note: this publication has been partially replaced by IEC 61163-1:2006 IEC 61163-2:1998

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Abstract

Serves as an application guide to a reliability stress screening process for electronic hardware. The concept, purpose and justification of the screening process are explained. The standard is intended as a guide to be used with one of the IEC reliability stress screening standards. It gives guidance in cases where it is essential that early failures be removed from the items manufactured in order to deliver them to the customer when the problems causing the early failures are solved. It gives guidance on where the reliability stress screening should be carried out, i.e. component, subsystem or system level.

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Additional information

Publication typeInternational Standard
Publication date1999-05-31
Edition1.0
Available language(s)English/French, Spanish
TC/SCTC 56 - Dependabilityrss
ICS03.120.01 - Quality in general
31.020 - Electronic components in general
Pages69
File size328 KB

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