IEC 60747-12:1991 Withdrawn

Semiconductor devices - Part 12: Sectional specification for optoelectronic devices

CHF 

Do you need a multi-user copy?

CHF 

Preview

Abstract

Gives details of the quality assessment procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for semiconductor optoelectronic devices. Applies to: -Semiconductor photo-emitters; opto-electronic displays; light-emitting diodes (LED); laser diodes. -Semiconductor photosensitive devices; photodiodes; phototransistors; photothyristors. -Semiconductor imaging devices. -Photocouplers, optocouplers.

Look inside


Additional information

Publication typeInternational Standard
Publication date1991-09-15
Withdrawal date2005-02-15
Edition1.0
Available language(s)English/French, Russian
TC/SCTC 47 - Semiconductor devicesrss
ICS31.260 - Optoelectronics. Laser equipment
Pages39
File size1428 KB

The following test report forms are related:


Share this page


Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa), PayPal and bank transfers as form of payment.


Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.