IEC 60747-12:1991 Withdrawn
Semiconductor devices - Part 12: Sectional specification for optoelectronic devices
Abstract
Gives details of the quality assessment procedures, the inspection
requirements, screening sequences, sampling requirements, test and
measurement procedures required for semiconductor optoelectronic
devices. Applies to:
-Semiconductor photo-emitters;
opto-electronic displays;
light-emitting diodes (LED);
laser diodes.
-Semiconductor photosensitive devices;
photodiodes;
phototransistors;
photothyristors.
-Semiconductor imaging devices.
-Photocouplers, optocouplers.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 1991-09-15 |
| Withdrawal date | 2005-02-15 |
| Edition | 1.0 |
| Available language(s) | English/French, Russian |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.260 - Optoelectronics. Laser equipment |
| Stability date | 2005 |
| Pages | 39 |
| File size | 1428 KB |
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