IEC 60749:1984/AMD2:1993 Withdrawn
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 1993-09-21 |
| Withdrawal date | 1996-10-28 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 1996 |
| Pages | 31 |
| File size | 1154 KB |
The following test report forms are related:
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