IEC 60749:1996 Withdrawn
Semiconductor devices - Mechanical and climatic test methods
Note: this publication has been partially replaced by IEC 60749-1:2002 IEC 60749-10:2002 IEC 60749-11:2002 IEC 60749-12:2002 IEC 60749-13:2002 IEC 60749-14:2003 IEC 60749-19:2003 IEC 60749-2:2002 IEC 60749-22:2002 IEC 60749-24:2004 IEC 60749-25:2003 IEC 60749-3:2002 IEC 60749-31:2002 IEC 60749-32:2002 IEC 60749-36:2003 IEC 60749-4:2002 IEC 60749-5:2003 IEC 60749-6:2002 IEC 60749-8:2002 IEC 60749-9:2002 IEC 60749-15:2003 IEC 60749-20:2002 IEC 60749-21:2004 IEC 60749-7:2002
Abstract
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 1996-10-27 |
| Withdrawal date | 2004-03-15 |
| Edition | 2.0 |
| Available language(s) | English/French, Spanish |
| TC/SC | TC 47 - Semiconductor devicesrss |
| ICS | 31.080.01 - Semiconductor devices in general |
| Stability date | 2004 |
| Pages | 95 |
| File size | 531 KB |
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