IEC 61000-3-3:2008 Withdrawn
Electromagnetic compatibility (EMC) - Part 3-3: Limits - Limitation of voltage changes, voltage fluctuations and flicker in public low-voltage supply systems, for equipment with rated current ≤16 A per phase and not subject to conditional connection
Abstract
IEC 61000-3-3:2008 is available as IEC 61000-3-3:2008 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.
IEC 61000-3-3:2008 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This part of IEC 61000 is applicable to electrical and electronic equipment having an input current equal to or less than 16 A per phase, intended to be connected to public low-voltage distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to conditional connection. The tests according to this part are type tests. Particular test conditions are given in annex A and the test circuit is shown in Figure 1. This second edition IEC 61000-3-3 cancels and replaces the first edition published in 1994, amendment 1 (2001) and amendment 2 (2005). This edition constitutes a revised edition.
IEC 61000-3-3:2008 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This part of IEC 61000 is applicable to electrical and electronic equipment having an input current equal to or less than 16 A per phase, intended to be connected to public low-voltage distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to conditional connection. The tests according to this part are type tests. Particular test conditions are given in annex A and the test circuit is shown in Figure 1. This second edition IEC 61000-3-3 cancels and replaces the first edition published in 1994, amendment 1 (2001) and amendment 2 (2005). This edition constitutes a revised edition.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2008-06-23 |
Withdrawal date | 2013-05-14 |
Edition | 2.0 |
Available language(s) | English/French, Spanish |
TC/SC | TC 77/SC 77A - EMC - Low frequency phenomenarss |
ICS | 33.100.10 - Emission |
Stability date | 2013 |
Pages | 50 |
File size | 1265 KB |
The following test report forms are related:
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