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IEC 61000-4-20 Revised

IEC 61000-4-20:2003
Electromagnetic compatibility (EMC) - Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
Relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. This includes open (for example, striplines and EMP simulators) and closed (for example, TEM cells) structures, which can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type.

The object of this standard is to describe

· TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations (EUT = equipment under test);

· TEM waveguide validation methods for EMC measurements;

· the EUT (i.e. EUT cabinet and cabling) definition;

· test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and

· test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides.

It has the status of a basic EMC publication in accordance with IEC Guide 107.
BASE PUBLICATION
  CHF 365.-
A more recent version of this publication exists: IEC 61000-4-20:2022

Technical committee

CISPR/CIS/A Radio-interference measurements and statistical methods

Category

Electromagnetic Compatibility

Keywords

Electromagnetic compatibility - EMC - Smart city
Publication typeInternational Standard
Publication date2003-01-29
Edition1.0
ICS

33.100.10

33.100.20

Withdrawal date2010-08-31
ISBN number2831868335
Pages129
File size1.05 MB
EditionDatePublicationEditionStatus

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