IEC 60444-11:2010
Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
Abstract
IEC 60444-11:2010 defines the standard method of measuring load resonance frequency fL at the nominal value of CL, and the determination of the effective load capacitance CLeff at the nominal frequency for crystals with the figure of merit M > 4.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2010-10-07 |
| Edition | 1.0 |
| Available language(s) | English/French |
| TC/SC | TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss |
| ICS | 31.140 - Piezoelectric devices |
| Stability date | 2025 |
| Pages | 28 |
| File size | 1102 KB |
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