IEC 60444-2
IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
CHFÂ 40.-
Technical committee
TC 49 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection| Publication type | International Standard |
| Publication date | 1980-01-01 |
| Edition | 1.0 |
| ICS | 31.140 |
| Stability date | 2026 |
| ISBN number | 2831806488 |
| Pages | 18 |
| File size | 635.68 KB |
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