IEC 60444-2:1980 

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units


Do you need a multi-user copy?




Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.

Look inside

Additional information

Publication typeInternational Standard
Publication date1980-01-01
Available language(s)English/French, Russian
TC/SCTC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss
ICS31.140 - Piezoelectric devices
Stability date  2023
File size679 KB

The following test report forms are related:

Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa, JCB and CUP), PayPal and bank transfers as form of payment.

Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.