IEC 60444-2:1980
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Abstract
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 1980-01-01 |
| Edition | 1.0 |
| Available language(s) | English/French, Russian |
| TC/SC | TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss |
| ICS | 31.140 - Piezoelectric devices |
| Stability date | 2026 |
| Pages | 18 |
| File size | 679 KB |
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