IEC 61338-1-5:2015 

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency


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IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition:
a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c)addition to bibliography.

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Additional information

Publication typeInternational Standard
Publication date2015-06-25
Available language(s)English/French
TC/SCTC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss
ICS31.140 - Piezoelectric devices
Stability date  2021
File size1577 KB

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