Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction;
b) changes to normative references;
c)addition to bibliography.
|Publication type||International Standard|
|TC/SC||TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss|
|ICS||31.140 - Piezoelectric devices|
|File size||1577 KB|
The following test report forms are related:
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