IEC 62228-2:2016
Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
Abstract
IEC 62228-2:2016 specifies test and measurement methods for EMC evaluation of LIN transceiver ICs under network condition. It defines test configurations, test conditions, test signals, failure criteria, test procedures, test setups and test boards. It is applicable for standard LIN transceiver ICs and ICs with embedded LIN transceiver and covers:
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).
- the emission of RF disturbances,
- the immunity against RF disturbances,
- the immunity against impulses and
- the immunity against electrostatic discharges (ESD).
Additional information
Publication type | International Standard |
---|---|
Publication date | 2016-11-18 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47/SC 47A - Integrated circuitsrss |
ICS | 31.200 - Integrated circuits. Microelectronics |
Stability date | 2026 |
Pages | 85 |
File size | 2536 KB |
The following test report forms are related:
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