IEC TS 62876-2-1:2018
Nanotechnology - Reliability assessment - Part 2-1: Nano-enabled photovoltaic devices - Stability test
Abstract
IEC TS 62876-2-1:2018 establishes a general stability testing programme to verify the stability of the performance of nanomaterials and nano-enabled photovoltaic devices (NePV) devices. These devices are used as subassemblies for the fabrication of photovoltaic modules through a combination with other components. This testing programme defines standardized degradation conditions, methodologies and data assessment for technologies. The results of these tests define a stability under standardized degradation conditions for quantitative evaluation of the stability of a new technology. The procedures outlined in this document were designed for NePV, but can be extended to serve as a guideline for other photovoltaic technologies as well.
Additional information
Publication type | Technical Specification |
---|---|
Publication date | 2018-08-29 |
Edition | 1.0 |
Available language(s) | English |
TC/SC | TC 113 - Nanotechnology for electrotechnical products and systemsrss |
ICS | 07.120 - Nanotechnologies 27.160 - Solar energy engineering |
Stability date | 2024 |
Pages | 30 |
File size | 1307 KB |
The following test report forms are related:
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