IEC 60749-5:2017 

Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

English
CHF 

Do you need a multi-user copy?

English
CHF 

Preview

Abstract

IEC 60749-5:2017(E) provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a)   correction of an error in an equation;
b)   inclusion of notes for guidance;
c)   clarification of the applicability of test conditions.

Look inside


Additional information

Publication typeInternational Standard
Publication date2017-04-10
Edition2.0
Available language(s)English
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2023
Pages9
File size1008 KB

Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). The following credit cards are accepted: American express, Mastercard and Visa. Request a pro forma to pay by bank transfer.


Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.