IEC 62884-2:2017 

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method


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IEC 62884-2:2017 specifies the methods for the measurement and evaluation of the phase jitter measurement of piezoelectric, dielectric and electrostatic oscillators, including dielectric resonator oscillators (DROs) and oscillators using a thin-film bulk acoustic resonator (FBAR) (hereinafter referred to as an "Oscillator") and gives guidance for phase jitter that allows the accurate measurement of RMS jitter.
In the measurement method, phase noise measurement equipment or a phase noise measurement system is used.
NOTE Dielectric resonator oscillators (DROs) and oscillators using FBAR are under consideration.

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Additional information

Publication typeInternational Standard
Publication date2017-08-30
Available language(s)English, English/French
TC/SCTC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss
ICS31.140 - Piezoelectric devices
Stability date  2026
File size1673 KB

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