Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
Two test fixtures are described in this document:
1) A fixture using the p-network circuit with electrical values as described in IEC 60444-1 for measurements in transmission mode up to 500 MHz. This fixture includes optional means to add physical load capacitors for the measurement of load resonance parameters up to 30 MHz in accordance with IEC 60444-4. The range of load capacitance is 10 pF or more. Calibration of the measurement system and CL adapter board is explained hereinafter.
2) A fixture based on the reflection method, suitable for a frequency range up to 1 200 MHz. No provisions for adding a physical load capacitance are anticipated. Load resonance parameters can be measured by using the method of IEC 60444-11.
This edition includes the following significant technical changes with respect to the previous edition:
a) modification of Clause 1;
b) modification of 5.2;
c) modification of 5.3;
d) modification of 5.4;
e) 6.3 Calibration of the reflection measurement system.
|Publication type||International Standard|
|Available language(s)||English, English/French|
|TC/SC||TC 49 - Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detectionrss|
|ICS||31.140 - Piezoelectric devices|
|File size||1838 KB|
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