IEC 62435-2
IEC 62435-2:2017
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms
IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.
CHFÂ 115.-
Technical committee
TC 47 Semiconductor devices| Publication type | International Standard |
| Publication date | 2017-01-24 |
| Edition | 1.0 |
| ICS | 31.020 |
| Stability date | 2031 |
| ISBN number | 9782832238363 |
| Pages | 36 |
| File size | 1.16 MB |
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