IEC 62435-2:2017 

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration mechanisms

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Abstract

IEC 62435-2:2017 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1:2017 for any device long-term storage whose duration may be more than 12 months for product scheduled for long duration storage.

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Additional information

Publication typeInternational Standard
Publication date2017-01-24
Edition1.0
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.020 - Electronic components in general
Stability date  2022
Pages36
File size1211 KB

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