IEC 60749-43:2017 Withdrawn
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans
Note: this publication has been replaced by IEC 63287-1:2021
Abstract
IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.
Additional information
Publication type | International Standard |
---|---|
Publication date | 2017-06-15 |
Withdrawal date | 2021-08-25 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47 - Semiconductor devicesrss |
ICS | 31.080.01 - Semiconductor devices in general |
Stability date | 2021 |
Pages | 74 |
File size | 1786 KB |
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