IEC 60749-43:2017 

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans


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IEC 60749-43:2017 gives guidelines for reliability qualification plans of semiconductor integrated circuit products (ICs). This document is not intended for military- and space-related applications.

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Additional information

Publication typeInternational Standard
Publication date2017-06-15
Available language(s)English/French
TC/SCTC 47 - Semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Stability date  2021
File size1729 KB

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