IEC 62899-503-1:2020 

Printed electronics - Part 503-1: Quality assessment - Test method of displacement current measurement for printed thin-film transistor


Do you need a multi-user copy?




IEC 62899-503-1:2020(E) specifies a test method for displacement current measurement (DCM) for printed thin film transistors (TFTs) or organic thin film transistors (OTFTs).

Look inside

Additional information

Publication typeInternational Standard
Publication date2020-05-27
Available language(s)English
TC/SCTC 119 - Printed Electronicsrss
ICS29.045 - Semiconducting materials
31.080.30 - Transistors
Stability date  2025
File size1682 KB

The following test report forms are related:

Share your publications

Learn how to share your publications with your colleagues, using networking options.

Payment information

Our prices are in Swiss francs (CHF). We accept all major credit cards (American Express, Mastercard and Visa), PayPal and bank transfers as form of payment.

Keep in touch

Keep up to date with new publication releases and announcements with our free IEC Just Published email newsletter.

Contact customer services

Please send your enquiry by email or call us on +41 22 919 02 11 between 09:00 – 17:00 CET Monday to Friday.