IEC 60747-11:1985 Withdrawn

Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices

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Abstract

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.

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Additional information

Publication typeInternational Standard
Publication date1985-01-01
Withdrawal date2015-12-31
Edition1.0
Available language(s)English/French
TC/SCTC 47/SC 47E - Discrete semiconductor devicesrss
ICS31.080.01 - Semiconductor devices in general
Pages35
File size1421 KB

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