IEC 60747-11:1985 Withdrawn
Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
Abstract
Applies to discrete semiconductor devices, excluding optoelectronic
devices. Should be read together with the generic specification to
which it refers: it gives details of the Quality Assessment
Procedures, the inspection requirements, screening sequences,
sampling requirements, test and measurement procedures required for
the assessment of semiconductor devices.
Additional information
Publication type | International Standard |
---|---|
Publication date | 1985-01-01 |
Withdrawal date | 2015-12-31 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47/SC 47E - Discrete semiconductor devicesrss |
ICS | 31.080.01 - Semiconductor devices in general |
Stability date | 2015 |
Pages | 35 |
File size | 1421 KB |
The following test report forms are related:
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