IEC 60747-14-3:2009
Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors
Abstract
IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity).
This publication should be read in conjunction with IEC 60747-1:2006.
This publication should be read in conjunction with IEC 60747-1:2006.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2009-04-29 |
| Edition | 2.0 |
| Available language(s) | English/French |
| TC/SC | TC 47/SC 47E - Discrete semiconductor devicesrss |
| ICS | 31.080.99 - Other semiconductor devices |
| Stability date | 2027 |
| Pages | 37 |
| File size | 1154 KB |
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