IEC 60747-14-3:2009 

Semiconductor devices - Part 14-3: Semiconductor sensors - Pressure sensors


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IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity).

This publication should be read in conjunction with IE C 60747-1:2006.

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Additional information

Publication typeInternational Standard
Publication date2009-04-29
Available language(s)English/French
TC/SCTC 47/SC 47E - Discrete semiconductor devicesrss
ICS31.080.99 - Other semiconductor devices
Stability date  2024
File size1154 KB

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