IEC 60747-5-3:1997 Withdrawn

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Note: this publication has been partially replaced by IEC 60747-5-4:2006 IEC 60747-5-5:2007 IEC 60747-5-6:2016 IEC 60747-5-7:2016

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Abstract

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

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Additional information

Publication typeInternational Standard
Publication date1997-09-05
Withdrawal date2016-02-23
Edition1.0
Available language(s)English/French
TC/SCTC 47/SC 47E - Discrete semiconductor devicesrss
ICS31.260 - Optoelectronics. Laser equipment
Stability date  2016
Pages61
File size320 KB

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