IEC 60747-5-3:1997 Withdrawn
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Note: this publication has been partially replaced by IEC 60747-5-4:2006 IEC 60747-5-5:2007 IEC 60747-5-6:2016 IEC 60747-5-7:2016
Abstract
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Additional information
Publication type | International Standard |
---|---|
Publication date | 1997-09-05 |
Withdrawal date | 2016-02-23 |
Edition | 1.0 |
Available language(s) | English/French |
TC/SC | TC 47/SC 47E - Discrete semiconductor devicesrss |
ICS | 31.260 - Optoelectronics. Laser equipment |
Stability date | 2016 |
Pages | 61 |
File size | 320 KB |
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