IEC 60747-5-3:1997+AMD1:2002 CSV Withdrawn
Consolidated version
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
Note: this publication has been partially replaced by IEC 60747-5-4:2006 IEC 60747-5-5:2007 IEC 60747-5-6:2016 IEC 60747-5-7:2016
Abstract
IEC 60747-5-3:1997+A1:2002 describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
This consolidated version consists of the first edition (1997)
and its amendment 1 (2002). Therefore, no need to order amendment in
addition to this publication.
This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
This publication is to be read in conjunction with IEC 60747-1:2006, IEC 62007-1:2008 and IEC 62007-2:2009.
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Additional information
| Publication type | International Standard |
|---|---|
| Publication date | 2009-11-25 |
| Withdrawal date | 2016-02-23 |
| Edition | 1.1 |
| Available language(s) | English/French |
| TC/SC | TC 47/SC 47E - Discrete semiconductor devicesrss |
| ICS | 31.080.99 - Other semiconductor devices |
| Stability date | 2016 |
| Pages | 86 |
| File size | 1426 KB |
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